electron microscopy
negative-stain electron microscopy
negative stain EM
CHMO:0000768
negative-stain EM
negative stain electron microscopy
Microscopy where the specimen is stained with heavy metals salts (to improve contrast) before being bombarded with a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50–150 kV under vacuum. The interaction of the electrons with the specimen produces transmitted, secondary, backscattered and diffracted electrons and characteristic X-rays which are detected.