transmission electron microscopy
transmission electron microscopy selected area electron diffraction
TEM-SAED
2009-03-17T10:24:51Z
CHMO:0001174
TEM SAD
TEM-SAD
TEM SAED
A method for determining structure by directing a beam of high energy (10–200 keV) electrons at the sample within a transmission electron microscope and recording the resulting diffraction pattern produced by any electrons transmitted through the sample.
https://orcid.org/0000-0001-5985-7429