atomic force microscopy
dynamic force microscopy
2009-06-02T10:51:10Z
dynamic scanning force microscopy
DSFM
tapping mode atomic force microscopy
AFM tapping-mode
intermittant-contact AFM
https://orcid.org/0000-0001-5985-7429
tapping-mode AFM
DFM
tapping mode AFM
intermittant-contact atomic force microscopy
CHMO:0001896
AC-mode AFM
intermittant contact atomic force microscopy
intermittant contact AFM
Microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. The tip oscillates, intermittently touching or tapping the surface. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning.
dynamic force AFM