dynamic force microscopy
shear force microscopy
dynamic shear force microscopy
shear-force AFM
2009-06-04T04:31:08Z
SMFM
CHMO:0001923
shear-force microscopy
ShFM
shear force atomic force microscopy
shear force modulation microscopy
shear force modulation mode AFM
shear-force atomic force microscopy
shear force modulation mode atomic force microscopy
Microscopy which uses a sharp spike (known as a 'tip') mounted on the end of a cantilever to scan the surface of the specimen. The tip oscillates parallel to the surface. An image of the surface is obtained by mechanically moving the probe in a raster scan of the specimen, line by line, and recording the force experienced by the tip as a function of position. A feedback loop is used to maintain a fixed relationship between the tip and surface during scanning.
shear-force controlled AFM
shear force AFM
https://orcid.org/0000-0001-5985-7429