high-angular annular dark-field scanning transmission electron microscopy
abberration-corrected high-angular annular dark-field scanning transmission electron microscopy
abberration-corrected high-angle annular dark-field scanning transmission electron microscopy
https://orcid.org/0000-0001-5985-7429
abberration corrected high angular annular dark field scanning transmission electron microscopy
Microscopy where a finely focused (<10 nm diameter) electron beam with an acceleration voltage 50-150 kV is scanned across an electron-transparent specimen under vacuum. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope. The electron beam is focused using a set of magnetic lenses which removes spherical aberration (an effect where the electron beam is deflected too strongly, resulting in a blurred image).
AC-HAADF-STEM
2009-07-31T01:46:06Z
CHMO:0002235
aberration-corrected transmission electron microscopy