scanning transmission electron micrograph
high-angular annular dark-field scanning transmission electron micrograph
https://orcid.org/0000-0001-5985-7429
CHMO:0002619
HAADF-STEM images
high angular annular dark-field scanning transmission electron micrograph
HAADF-STEM image
An image obtained by scanning the specimen with a finely focused (<10 nm diameter) electron beam under vacuum and measuring the intensities of the transmitted electrons. The beam of electrons is scattered or diffracted at high angles before reaching the specimen, and the image results from a weakening of the beam by its interaction with the sample. An annular aperture is used to select electrons that have passed through given symmetric zones within the objective lens of the microscope.
high angle annular dark field scanning transmission electron micrograph
high-angle annular dark-field scanning transmission electron micrograph
2009-11-24T04:00:55Z